๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Microstructure and Properties of Solution Deposited, Nb-Doped PZT Thin Films

โœ Scribed by M. Es-Souni; A. Piorra; C.-H. Solterbeck; S. Iakovlev; M. Abed

Book ID
110425486
Publisher
Springer US
Year
2002
Tongue
English
Weight
895 KB
Volume
9
Category
Article
ISSN
1385-3449

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Chemical solution deposition of PZT thin
Chemical solution deposition of PZT thin films for microelectronics
โœ M Kosec; B Malic; M Mandeljc ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 398 KB

Research into chemical solution deposition (CSD) methods for ferroelectric thin films is oriented towards higher reliability and lower processing temperatures. In this paper several aspects of CSD PZT thin films related to processing are discussed. The reliability of PZT thin films is related to the

Structural and electrical properties of
Structural and electrical properties of solโ€“gel deposited Pb(Zr0.92Ti0.08)O3 thin films doped with Nb
โœ L. Pintilie; I. Boerasu; M. Pereira; M.J.M. Gomes ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 250 KB

Pb(Zr, Ti)O 3 (PZT) thin films with Zr/Ti ratio of 92/8 and doped with up to 4 at.% Nb were deposited by sol-gel on Pt coated Si substrates. The scope was to investigate the influence of Nb additive on the structural, optical and electrical properties of Zr-rich PZT phase. It was found that a residu