Microstructure and magnetic properties of FePt-SiO2perpendicular recording media

✍ Scribed by Hu, J. F. ;Chen, J. S. ;Lim, B. C. ;Liu, B.

• Book ID: 105364413
• Publisher: John Wiley and Sons
• Year: 2008
• Tongue: English
• Weight: 438 KB
• Volume: 205
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200723037

✦ Synopsis

Abstract

FePt–SiO~2~ films with different volume percentage (0–20%) of SiO~2~ were prepared by a co‐sputtering process at a substrate temperature of 350 °C. The microstructure and magnetic properties of the composite films were investigated. Inhomogeneous SiO~2~ segregation in the composite films was observed. It was found that the SiO~2~ segregation depended on the sputter power used for FePt and SiO~2~ deposition. For low sputter power, most of the SiO~2~ was located at the film surface. As the sputter power increased, a two‐layer film composed of a continuous FePt layer on the bottom and a FePt–SiO~2~ composite layer on the top was observed. The possible reasons for SiO~2~ accumulation on the surface and the two‐layer film growth are proposed. The results suggested that the SiO~2~ segregation at high temperature was very sensitive to the dynamic film growth process. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)