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Microstructure and hardness of nanocrystalline Ti1−x−yAlxSiyN thin films

✍ Scribed by D. Rafaja; A. Poklad; V. Klemm; G. Schreiber; D. Heger; M. Šíma

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 762 KB
Volume: 462
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2005.11.086

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