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Microstructural evaluation of optical materials and devices using a combination of focused ion beam sputtering and transmission electron microscopy

✍ Scribed by Robert Hull

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 785 KB
Volume: 6
Category: Article
ISSN: 0925-3467
DOI: 10.1016/0925-3467(96)00023-7

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