Effect of microstructure on passive film
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Jerome Kruger; R. Scott Lillard; Christopher C. Streinz; Patrick J. Moran
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Article
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1995
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Elsevier Science
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English
β 777 KB
The role played by microstructural features in the passivation and breakdown processes which lead to pitting has been examined for the first time by the new techniques of dynamic imaging microellipsometry (DIM) and local electrochemical impedance spectroscopy (LEIS). Contrary to expectations, an exa