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Microstructural characterization of YBa2Cu3O 7-δ thin films on SrTiO3 using four-axis X-ray diffraction

✍ Scribed by Sizemore, J.; Barton, R.; Marshall, A.; Bravman, J.C.; Naito, M.; Char, K.

Book ID: 114550215
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 569 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92850

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