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Microstructural characterization of electroconductive Si3N4–TiN composites

✍ Scribed by Byong-Taek Lee; Yeu-Joo Yoon; Kap-Ho Lee

Book ID: 117356142
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 750 KB
Volume: 47
Category: Article
ISSN: 0167-577X
DOI: 10.1016/s0167-577x(00)00214-7

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