Microstructural characteristization of InGaN/GaN epitaxial Layers with Pt nanoclusters grown by using MOCVD on c-plane sapphire substrates

✍ Scribed by Zhixin Wan, Yinsheng He, Keesam Shin, Cheljong Choi, Eunkyung Suh

• Book ID: 119936989
• Publisher: The Korean Physical Society
• Year: 2012
• Tongue: English
• Weight: 426 KB
• Volume: 61
• Category: Article
• ISSN: 0374-4884
• DOI: 10.3938/jkps.61.1283