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Microscopic phonon theory of Si/Ge nanocrystals

โœ Scribed by Cheng, Wei ;Marx, David ;Ren, Shang-fen


Book ID
107378887
Publisher
Higher Education Press and Springer
Year
2008
Tongue
English
Weight
470 KB
Volume
3
Category
Article
ISSN
1673-3487

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Surface oxide layers for5ed on gas-evaporated Si and Ge microcrystals as small as 1OOA were investigated by means of infrared spectroscopy, high-resolution electron Ficroscopy and X-ray photoemission spectroscopy. It is shown that 20A-thick native oxide layers in the form of SiO, with x=-1.2 are fir