✦ LIBER ✦

Microscopic determination of energy surfaces at very high spin states

✍ Scribed by Ploszajczak, M. ;Sandhya Devi, K. R. ;Faessler, Amand

Publisher: Springer
Year: 1977
Tongue: English
Weight: 849 KB
Volume: 282
Category: Article
ISSN: 1434-601X
DOI: 10.1007/bf01414894

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A new possibility of identifying high-sp

A new possibility of identifying high-spin states at high excitation energies

✍ Schrader, M. ;Szanto de Toledo, A. ;Klapdor, H. V. 📂 Article 📅 1979 🏛 Springer 🌐 English ⚖ 275 KB

Spin lattice relaxation in triplet state

Spin lattice relaxation in triplet states of naphthalene crystals at very high magnetic fields

✍ K.F. Renk; H. Sixl; H. Wolfrum 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 429 KB

Spm Lttttcc reiaxdtmn times of rnetact:iblc trq&!t states in dn org:mic molcfular crystal were mcabured at hq$~ magnetic fields up to energy level splitttngs &E near the Debyc acoustx limit. By an opticai method we Sound that the drrcct-process relaxation of the r?r = +1 Zceman state is domixttcd by

Microscopic analysis of surface state of

Microscopic analysis of surface state of SUS-304L stainless steel by low energy scanning electron microscopy in ultra high vacuum

✍ Y. Ishikawa; N. Awaya; Y. Nakazawa; H. Yamadera; T. Ichinokawa 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 47 KB

Application of spectroscopic photoemissi

Application of spectroscopic photoemission and low energy electron microscope to high-k gate dielectrics: Relationship between surface morphology and electronic states during Hf-silicide formation

✍ R. Yasuhara; T. Taniuchi; H. Kumigashira; M. Oshima; F. Guo; T. Kinoshita; K. On 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 671 KB

We have applied the spectroscopic photoemission and low energy electron microscope to study high-k gate dielectrics and have performed the following in situ operations during ultrahigh vacuum annealing: real-time observation of surface morphology and microregion photoelectron spectroscopy measuremen