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Microscopic bonding and macroscopic strain relaxations at Si-SiO2interfaces

✍ Scribed by G. Lucovsky; J.C. Phillips

Book ID: 106019101
Publisher: Springer
Year: 2004
Tongue: English
Weight: 544 KB
Volume: 78
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-003-2403-2

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