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Microdefect Density Determination by X-Ray Huang Scattering Normalized over Thermal Diffuse Scattering

✍ Scribed by Charnyi, L. A. ;Sherbachev, K. D. ;Bublik, V. T.

Book ID: 105382957
Publisher: John Wiley and Sons
Year: 1991
Tongue: English
Weight: 351 KB
Volume: 128
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211280205

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