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Microbridge testing of silicon oxide/silicon nitride bilayer films deposited on silicon wafers

โœ Scribed by Y.-J. Su; C.-F. Qian; M.-H. Zhao; T.-Y. Zhang


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
747 KB
Volume
48
Category
Article
ISSN
1359-6454

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