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Micro-Raman depth profile investigations of beveled Al+-ion implanted 6H-SiC samples

✍ Scribed by J. Żuk; J. Romanek; W. Skorupa


Book ID
103863277
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
589 KB
Volume
267
Category
Article
ISSN
0168-583X

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