✦ LIBER ✦
Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples
✍ Scribed by J. Wasyluk; P. V. Rainey; T. S. Perova; S. J. N. Mitchell; D. W. McNeill; H. S. Gamble; B. M. Armstrong; R. Hurley
- Book ID
- 112134733
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 470 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.3052
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