Micro FTIR Mapping of Nanometer Ferroelectric Polymer Films

✍ Scribed by Naomi Eidelman; Naoto Tsutsumi; Chwan-Kang Chiang

• Book ID: 102491523
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 194 KB
• Volume: 27
• Category: Article
• ISSN: 1022-1336
• DOI: 10.1002/marc.200500874

✦ Synopsis

Abstract

Summary: Highly crystalline ferroelectric polymer films [vinyidene fluoride and trifluoroethylene, β‐P(VDF‐TrFE), 260–15 nm thick] were characterized with FTIR reflectance‐transmission microspectroscopy (FTIR‐RTM) mapping technique (400 µm × 400 µm spatial resolution). The amorphous and crystalline fractions were identified locally. FTIR‐RTM maps (1 cm^2^ area) provided a unique in‐depth view of the ultrathin films. Lower film thickness suppressed growth of the crystalline phase. Increased content of amorphous phase lead to non‐uniform films with degraded ferroelectric behavior.

FTIR‐RTM maps of the distribution of the amorphous phase in the 80 and 35 nm films.

magnified imageFTIR‐RTM maps of the distribution of the amorphous phase in the 80 and 35 nm films.