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Micro-characterisation of Si wafers by high-pressure thermopower technique

✍ Scribed by Sergey V. Ovsyannikov; Vsevolod V. Shchennikov Jr; Nadezda A. Shaydarova; Vladimir V. Shchennikov; Andrzej Misiuk; Deren Yang; Irina V. Antonova; Sergey N. Shamin


Book ID
108239026
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
316 KB
Volume
376-377
Category
Article
ISSN
0921-4526

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