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Metrological certification for X-ray-spectral fluorescence analysis (XFA)

✍ Scribed by A. G. Chesnokov; V. V. Gorbachev; I. N. Solov'eva; N. M. Mel'nikova

Publisher: Springer US
Year: 1989
Tongue: English
Weight: 210 KB
Volume: 46
Category: Article
ISSN: 0361-7610
DOI: 10.1007/bf00677719

No coin nor oath required. For personal study only.

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