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Methods for measuring the dimensionless resistance coefficient of a solid body in a rarefied medium

✍ Scribed by V. I. Krivotsyuk

Publisher
Springer US
Year
1995
Tongue
English
Weight
434 KB
Volume
38
Category
Article
ISSN
0543-1972

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A novel high frequency measurement method for determining the base resistance of the bipolar transistor is presented. The new method is based on the short-circuit input impedance measurements. The measurement is performed at lower frequencies compared to the circlediagram method and therefore can be