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Methods for measurement and simulation of weak substrate coupling in high-speed bipolar ICs

โœ Scribed by Steiner, W.; Pfost, M.; Rein, H.-M.; Sturmer, A.; Schuppen, A.


Book ID
114659570
Publisher
IEEE
Year
2002
Tongue
English
Weight
314 KB
Volume
50
Category
Article
ISSN
0018-9480

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