𝔖 Bobbio Scriptorium

✦ LIBER ✦

Methods and failure rates of integrated circuits: Le Comte M. Jeumont-Schneider. Proc. CNET Conference on Reliability and Maintainability, Tregastel, France, p. 491 (8–12 September 1980). (In French)

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 116 KB
Volume: 21
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(81)90273-0

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