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A modular method for LSI circuits testing: G. Jasinevitchene, B. Burgis and E. Metsaev. Proc. CNET Conference on Reliability and Maintainability, Tregastel, France, p. 1 (8–12 September 1980).


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
108 KB
Volume
21
Category
Article
ISSN
0026-2714

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