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Method for Measuring Thickness of Dielectric Films Using Microdielectric Fringe-Effect Sensors

✍ Scribed by Choi, Yunn-Hong; Tathireddy, Prashant; Skliar, Mikhail


Book ID
111688169
Publisher
American Chemical Society
Year
2006
Tongue
English
Weight
317 KB
Volume
78
Category
Article
ISSN
0003-2700

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