Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

✍ Scribed by Ruíz-Pérez, J J; González-Leal, J M; Minkov, D A; Márquez, E

• Book ID: 120455591
• Publisher: Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 313 KB
• Volume: 34
• Category: Article
• ISSN: 0022-3727
• DOI: 10.1088/0022-3727/34/16/314