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Method for measuring the integral radiation, transmission, and reflection coefficients for selective transluscent materials

✍ Scribed by G. K. Kholopov


Publisher
Springer US
Year
1992
Tongue
English
Weight
520 KB
Volume
62
Category
Article
ISSN
1573-871X

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## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me