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Metal/TaN (≈5 nm)/Si diode fabricated by DC magnetron sputtering

✍ Scribed by Q. X. Jia; K. Ebihara; T. Ikegami; W. A. Anderson


Publisher
Springer
Year
1994
Tongue
English
Weight
446 KB
Volume
58
Category
Article
ISSN
1432-0630

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Electrical properties of Ta/n-Si and Ta/p-Si Schottky barrier diodes obtained by sputtering of tantalum (Ta) metal on semiconductors have been investigated. The characteristic parameters of these contacts like barrier height, ideality factor and series resistance have been calculated using current v