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Metal–semiconductor interface in extreme temperature conditions

✍ Scribed by L.P. Bulat; I.A. Erofeeva; Yu.V. Vorobiev; J. González-Hernández

Book ID: 104002656
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 115 KB
Volume: 255
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2008.07.007

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