Electron beam lithography of HSQ/PMMA bi
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Haifang Yang; Aizi Jin; Qiang Luo; Junjie Li; Changzhi Gu; Zheng Cui
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Article
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2008
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Elsevier Science
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English
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A HSQ/PMMA bilayer resist system, in which HSQ as negative tone electron beam resist top layer and PMMA as bottom layer, has been investigated for negative tone lift-off process. Patterns are first defined on the HSQ resist using electron beam lithography, and then transferred into the bottom PMMA l