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Mesoscopic fluctuations in the conductance of silicon-based MOS structures with a doped surface layer

✍ Scribed by B. A. Aronzon; A. S. Vedeneev; A. M. Kozlov; A. A. Panferov; V. V. Ryl’kov

Book ID: 111451556
Publisher: SP MAIK Nauka/Interperiodica
Year: 2007
Tongue: English
Weight: 184 KB
Volume: 52
Category: Article
ISSN: 1064-2269
DOI: 10.1134/s1064226907100129

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