Memory traps in MNOS diodes measured by thermally stimulated current : Teruaki Katsube, Yoshio Adachi and Toshiaki Ikoma. Solid State Electronics19, 11 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 130 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90340-1