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Memory traps in MNOS diodes measured by thermally stimulated current

✍ Scribed by Teruaki Katsube; Yoshio Adachi; Toshiaki Ikoma

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 554 KB
Volume: 19
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(76)90125-8

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