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Memory Properties of Nickel Silicide Nanocrystal Layer for Possible Application to Nonvolatile Memory Devices

✍ Scribed by Yoo-Sung Jang; Jong-Hwan Yoon

Book ID: 114619830
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 525 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2033320

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