Melting temperature of amorphized silicon heated by nanosecond laser radiation
β Scribed by Ivlev, G. D. ;Malevich, V. L. ;Zhidkov, V. V.
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 234 KB
- Volume
- 106
- Category
- Article
- ISSN
- 0031-8965
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π SIMILAR VOLUMES
The temperature of a dielectric surface irradiated by a laser pulse can be measured by recording the time-resolved resistance change of a thin platinum stripe vapor-deposited on this surface. Results are reported for quartz and glass surfaces exposed to a pulsed COz laser, showing heating rates in e
Recently, Zenobi, Hahn and Zare introduced thin-film resistance sensors for the surface temperature measurement of dielectric materials heated by pulsed laser radiation. They concluded that absorption or reflection by their thin-film sensor is in any case negligible, thus causing no systematic error