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Mechanism of Biaxial Alignment of Oxide Thin Films during Ion-Beam-Assisted Deposition

โœ Scribed by Kevin G. Ressler; Neville Sonnenberg; Michael J. Cima


Book ID
118699743
Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
529 KB
Volume
80
Category
Article
ISSN
0002-7820

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