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Mechanism for single-event burnout of power MOSFETs and its characterization technique

โœ Scribed by Kuboyama, S.; Matsuda, S.; Kanno, T.; Ishii, T.


Book ID
119994727
Publisher
IEEE
Year
1992
Tongue
English
Weight
468 KB
Volume
39
Category
Article
ISSN
0018-9499

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