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Novel Palladium Germanide Schottky Contact for High Performance Schottky Barrier Ge MOSFETs and Characterization of Its Leakage Current Mechanism

✍ Scribed by Oh, Se-Kyung; Shin, Hong-Sik; Kang, Min-Ho; Lee, Ga-Won; Lee, Hi-Deok


Book ID
115508934
Publisher
American Scientific Publishers
Year
2012
Tongue
English
Weight
644 KB
Volume
12
Category
Article
ISSN
1533-4880

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