Mechanical properties of porous methyl silsesquioxane and nanoclustering silica films using atomic force microscope

✍ Scribed by C. Gaire; Y. Ou; H. Arao; M. Egami; A. Nakashima; R. C. Picu; G.-C. Wang; T.-M. Lu

• Book ID: 106425026
• Publisher: Springer
• Year: 2008
• Tongue: English
• Weight: 413 KB
• Volume: 17
• Category: Article
• ISSN: 1380-2224
• DOI: 10.1007/s10934-008-9259-y