𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Mechanical device for morphometric and orientational analysis of biological structures

✍ Scribed by G. E. Zagoruiko; V. N. Ofitserov


Publisher
Springer US
Year
1979
Tongue
English
Weight
353 KB
Volume
88
Category
Article
ISSN
0007-4888

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Mechanical failure analysis of thin film
✍ Y. Leterrier; A. Pinyol; D. GilliΓ©ron; J.-A. E. MΓ₯nson; P.H.M. Timmermans; P.C.P πŸ“‚ Article πŸ“… 2010 πŸ› Elsevier Science 🌐 English βš– 576 KB

The crack onset strain (COS) of 4-level thin film transistor (TFT) devices on both steel foils and thin polyimide (PI) films was investigated using tensile experiments carried out in situ in an optical microscope. Cracks initiated first within the SiO 2 insulator layer for both types of substrates.