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Mechanical characterization of thin layer of chromium on steel substrate by acoustic methods

✍ Scribed by Boudour, A. ;Boumaïza, Y. ;Guerioune, M. ;Belkahla, S.

Book ID
105362524
Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
324 KB
Volume
201
Category
Article
ISSN
0031-8965

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## Abstract The atomic force acoustic microscopy (AFAM) technique has been used to determine elastic properties of films with thicknesses decreasing from several hundreds of nanometers to several nanometers. It has been shown that metal films as thin as 50 nm can be characterized directly without t