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Characterization of chromium silicide thin layer formed on amorphous silicon films

✍ Scribed by D. Caputo; G. de Cesare; M. Ceccarelli; A. Nascetti; M. Tucci; L. Meda; M. Losurdo; G. Bruno

Book ID: 116670995
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 267 KB
Volume: 354
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2007.10.040

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