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Measuring stacking fault densities in shock-compressed FCC crystals using in situ x-ray diffraction

✍ Scribed by Rosolankova, K; Wark, J S; Bringa, E M; Hawreliak, J

Book ID: 118172715
Publisher: Institute of Physics
Year: 2006
Tongue: English
Weight: 350 KB
Volume: 18
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/18/29/014

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