Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction

✍ Scribed by Comley, A. J.; Maddox, B. R.; Rudd, R. E.; Prisbrey, S. T.; Hawreliak, J. A.; Orlikowski, D. A.; Peterson, S. C.; Satcher, J. H.; Elsholz, A. J.; Park, H.-S.; Remington, B. A.; Bazin, N.; Foster, J. M.; Graham, P.; Park, N.; Rosen, P. A.; Rothman, S. R.; Higginbotham, A.; Suggit, M.; Wark, J. S.

• Book ID: 120458286
• Publisher: The American Physical Society
• Year: 2013
• Tongue: English
• Weight: 432 KB
• Volume: 110
• Category: Article
• ISSN: 0031-9007
• DOI: 10.1103/PhysRevLett.110.115501