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Measuring flicker fluctuations in semiconductor diode conductivity

โœ Scribed by A. V. Yakimov


Book ID
112466085
Publisher
Springer US
Year
1974
Tongue
English
Weight
247 KB
Volume
17
Category
Article
ISSN
0033-8443

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A theoretical study is presented on the statistical properties of conductivity fluctuations caused by concentration and mobility fluctuations of the current carriers. It is established that mobility fluctuations result from random deviations in the thermal equilibrium distribution of the carriers. I