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Non-Gaussian conductivity fluctuations in semiconductors

โœ Scribed by S.V. Melkonyan


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
243 KB
Volume
405
Category
Article
ISSN
0921-4526

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โœฆ Synopsis


A theoretical study is presented on the statistical properties of conductivity fluctuations caused by concentration and mobility fluctuations of the current carriers. It is established that mobility fluctuations result from random deviations in the thermal equilibrium distribution of the carriers. It is shown that mobility fluctuations have generation-recombination and shot components which do not satisfy the requirements of the central limit theorem, in contrast to the current carrier's concentration fluctuation and intraband component of the mobility fluctuation. It is shown that in general the mobility fluctuation consist of thermal (or intraband) Gaussian and non-thermal (or generationrecombination, shot, etc.) non-Gaussian components. The analyses of theoretical results and experimental data from literature show that the statistical properties of mobility fluctuation and of 1/f-noise fully coincide. The deviation from Gaussian statistics of the mobility or 1/f fluctuations goes hand in hand with the magnitude of non-thermal noise (generation-recombination, shot, burst, pulse noises, etc.).


๐Ÿ“œ SIMILAR VOLUMES


Critical and Gaussian conductivity fluct
โœ P. Pureur; R.Menegotto Costa; P. Rodrigues Jr.; J.V. Kunzler; J. Schaf; L. Ghive ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 139 KB

Systemauc conductivity lluctuatmn measurements are reported for polycryatalhne YBa2Cu3OT\_ 8 and singlecrystal Bi2Sr2CaCu208. Gaussian and criucal regimes are observed For both systems, the crmcal exponents are consistent with s-wave pairmg.