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Measuring depth of point defects in polished surfaces by means of a linnik microinterferometer

✍ Scribed by B. A. Chunin

Book ID
112455045
Publisher
Springer US
Year
1969
Tongue
English
Weight
107 KB
Volume
12
Category
Article
ISSN
0543-1972

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πŸ“œ SIMILAR VOLUMES

Contact potential difference measurement
Contact potential difference measurements on real semiconductor surfaces by means of a point vibrating electrode
✍ J. SochaΕ„ski πŸ“‚ Article πŸ“… 1962 πŸ› John Wiley and Sons 🌐 English βš– 229 KB

## Abstract Changes of contact potential are observed in inversion layers induced in germanium by applying a reverse bias voltage in the vicinity of a p‐n junction. Comparison is made with changes of surface potential calculated from simultaneous measurements of channel conductance. Agreement is go