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Measurements of the Rectifying Barrier Height of Sputter Deposited Bi2Te3 Contacts on p-Silicon

✍ Scribed by Koshy, J.

Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 173 KB
Volume: 89
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210890258

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