Measurements of the mechanicalQof single-crystal silicon at low temperatures
โ Scribed by D. F. McGuigan; C. C. Lam; R. Q. Gram; A. W. Hoffman; D. H. Douglass; H. W. Gutche
- Publisher
- Springer US
- Year
- 1978
- Tongue
- English
- Weight
- 359 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0022-2291
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๐ SIMILAR VOLUMES
We have measured the low temperature mechanical properties of a high Q oscillator fabricated from single crystal silicon. Operated at strains of 10m7, the oscillator exhibits unusual behavior in both the dissipation and resonant frequency. In addition, we have performed systematic frequency sweeps t
The fracture behavior of both strain-anneal grown and melt-grown tungsten single crystals of high purity was investigated in the temperature range of 77ยฐK and room temperature. It was found that in the absence of surface defects and weak boundaries crystals of all orientations rupture at room temper