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Measurements of degradation of silicon detectors and electronics in various radiation environments

✍ Scribed by Eric Beuville; Patrizia Cenci; Andrea Federspiel; Claus Gössling; Erik H.M. Heijne; Pierre Jarron; Hobart W. Kraner; Tom Massam; David Munday; Trivan Pal

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 870 KB
Volume: 288
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(90)90465-i

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