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Measurements and analysis of neutron-reaction-induced charges in a silicon surface region

โœ Scribed by Tosaka, Y.; Satoh, S.; Suzuki, K.; Sugii, T.; Nakayama, N.; Ehara, H.; Woffinden, G.A.; Wender, S.A.


Book ID
114554841
Publisher
IEEE
Year
1997
Tongue
English
Weight
124 KB
Volume
44
Category
Article
ISSN
0018-9499

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