Measurement of w-InN/h-BN Heterojunction Band Offsets by X-Ray Photoemission Spectroscopy

✍ Scribed by J. M. Liu; X. L. Liu; X. Q. Xu; J. Wang; C. M. Li; H. Y. Wei; S. Y. Yang; Q. S. Zhu; Y. M. Fan; X. W. Zhang; Z. G. Wang

• Book ID: 107470771
• Publisher: Springer-Verlag
• Year: 2010
• Tongue: English
• Weight: 279 KB
• Volume: 5
• Category: Article
• ISSN: 1931-7573
• DOI: 10.1007/s11671-010-9650-x